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1
von Rassoul, N. ; Labbate, L. A. ; Eneman, G. ; et al.
2025 Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2025 Symposium on. :1-3 Jun, 2025
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2
Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability
von Ravsher, T. ; Sharifi, S. H. ; Fantini, A. ; et al.
2021 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2021 IEEE International. :1-4 May, 2021
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3
von Mehendale, M. ; Antonelli, A. ; Mair, R. ; et al.
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2021 32nd Annual SEMI. :1-4 May, 2021
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4
von Rao, S. ; Kim, W. ; van Beek, S. ; et al.
2021 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2021 IEEE International. :1-4 May, 2021
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5
von Sharifi, S. Houshmand ; Chasin, A. ; Fantini, A. ; et al.
2020 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2020 IEEE International. :1-4 May, 2020
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6
von Sakhare, S. ; Rao, S. ; Perumkunnil, M. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(9):3618-3625 Sep, 2020
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7
von Wu, Y. C. ; Garello, K. ; Kim, W. ; et al.
Phys. Rev. Applied 15, 064015 (2021)
Schlagworte: Condensed Matter - Mesoscale and Nanoscale Physics
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8
von Crotti D. ; Pantelaki E. ; Maggi E. ; et al.
Schlagworte: cycling holiday; multivariate analysi; non-urban destination; public transport; sustainable travels
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9
von Couet, S. ; Rao, S. ; Van Beek, S. ; et al.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
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10
von Doevenspeck, J. ; Garello, K. ; Verhoef, B. ; et al.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
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11
von Garello, K. ; Yasin, F. ; Couet, S. ; et al.
2018 IEEE Symposium on VLSI Circuits
Schlagworte: Condensed Matter - Mesoscale and Nanoscale Physics; Computer Science - Emerging Technologies; Physics - Applied Physics
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12
Deterministic and Field-Free Voltage-Controlled MRAM for High Performance and Low Power Applications
von Wu, Y. C. ; Kim, W. ; Garello, K. ; et al.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
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13
von Garello, K. ; Yasin, F. ; Hody, H. ; et al.
2019 Symposium on VLSI Technology
Schlagworte: Physics - Applied Physics
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14
von Bruno, A. ; Caudai, C. ; Leone, G. R. ; et al.
Schlagworte: Computer Science - Computer Vision and Pattern Recognition
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15
von Zucca, M. ; Pogliano, U. ; Modarres, M. ; et al.
Schlagworte: Physics - Instrumentation and Detectors
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16
von Van Beek, S. ; O'Sullivan, B. J. ; Roussel, P. J. ; et al.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :25.2.1-25.2.4 Dec, 2018
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17
Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node
von Sakhare, S. ; Perumkunnil, M. ; Bao, T. Huynh ; et al.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :18.3.1-18.3.4 Dec, 2018
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18
von Sankaran, K. ; Swerts, J. ; Carpenter, R. ; et al.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :40.5.1-40.5.4 Dec, 2018
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19
von O'Sullivan, B J ; Van Beek, S ; Roussel, Ph. J. ; et al.
2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :P-MY.5-1-P-MY.5-6 Mar, 2018
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20
von Crotti D. ; Maggi E. ; Crotti, D. ; et al.
Schlagworte: Corporate Social Responsibility; City Logistic; Urban Distribution Centre; Logistics Service Provider; Hotelling Competition
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21
von Pantelaki E. ; Crotti D. ; Maggi E. ; et al.
Schlagworte: Bike tourism; Latent class analysi; Demand segmentation; Multimodal transport; Cycling holidays
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22
von Van Beek, S. ; Martens, K. ; Roussel, P. ; et al.
2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :5A-1.1-5A-1.5 Apr, 2017
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23
von Pantelaki, E ; Maggi, E ; Crotti, D ; et al.
Schlagworte: Aging; Internet use; Digital inclusivene; Exploratory factor analysi; Latent class analysi; Capability approach
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24
von Swerts, J. ; Liu, E. ; Couet, S. ; et al.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :38.6.1-38.6.4 Dec, 2017
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25
von Crotti D. ; Ferrari C. ; Tei A. ; et al.
Schlagworte: Liner shipping; Competition assessment; Integration; Non-cooperative games
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