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von Dhar, Siddhartha ; Monfray, Stephane ; Gianesello, Frederic ; et al.
2023 IEEE 23rd Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems Silicon Monolithic Integrated Circuits in RF Systems, 2023 IEEE 23rd Topical Meeting on. :38-40 Jan, 2023
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von Vidal-Dho, Matthias ; Hubert, Quentin ; Gonon, Patrice ; et al.
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2020 IEEE 33rd International Conference on. :1-4 May, 2020
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Moisture Influence on Reliability and Electrical Characteristics of SiOC:H Low-k Dielectric Material
von Vidal-Dho, Matthias ; Hubert, Quentin ; Gonon, Patrice ; et al.
2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-4 Oct, 2019
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von Vidal-Dho, Matthias ; Hubert, Quentin ; Gonon, Patrice ; et al.
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :176-179 Mar, 2019
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von Blayac, Sylvain ; Rivero, Christian ; Fornara, Pascal ; et al.
2011 IEEE ICMTS International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on. :201-204 Apr, 2011
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Impact of hump effect on MOSFET mismatch in the sub-threshold area for low power analog applications
von Joly, Yohan ; Lopez, Laurent ; Portal, Jean-Michel ; et al.
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on. :1817-1819 Nov, 2010
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von Newman, Andréa ; Campos, Andrea ; Pujol, David ; et al.
ISSN: 1369-8001 ; Materials Science in Semiconductor Processing ; https://hal.science/hal-04285750 ; Materials Science in Semiconductor Processing, 2023, 162, pp.107488. ⟨10.1016/j.mssp.2023.107488⟩.
Schlagworte: Cobalt silicide Surface preparation Agglomeration Nucleation; [CHIM.MATE]Chemical Sciences/Material chemistry
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von Pavan, Nicola ; Autorino, Riccardo ; Lee, Hak ; et al.
World Journal of Urology. October 2016 34(10):1473-1479
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von Patrick Calenzo ; Jean-René Raguet ; Romain Laffont ; et al.
Journal of Systemics, Cybernetics and Informatics, Vol 8, Iss 5, Pp 12-16 (2010)
Schlagworte: Zener Effect; Low Cost; Low Consumption; Single Poly-Silicon Memory; Information technology; T58.5-58.64; Communication. Mass media; P87-96
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von Bénard, Christelle ; Math, Gaëtan ; Fornara, Pascal ; et al.
In Microelectronics Reliability 2009 49(9):1008-1012
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von Greco, Francesco ; Autorino, Riccardo ; Rha, Koon H. ; et al.
In European Urology August 2013 64(2):314-322
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von Autorino, Riccardo ; Kaouk, Jihad H. ; Yakoubi, Rachid ; et al.
In The Journal of Urology June 2012 187(6):1989-1994
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von Kaouk, Jihad H. ; Autorino, Riccardo ; Kim, Fernando J. ; et al.
In European Urology November 2011 60(5):998-1005
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von Joly, Yohan ; Lopez, Laurent ; Truphemus, Laurent ; et al.
IEEE Transactions on Electron Devices ; volume 60, issue 3, page 1263-1267 ; ISSN 0018-9383 1557-9646
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von Orellana, Sebastian ; Arrazat, Brice ; Fornara, Pascal ; et al.
ISSN: 0026-2714.
Schlagworte: Thermo-mechanical; Finite element modelling; Embedded sensor; Back End Of Line; Residual stress; [SPI.MAT]Engineering Sciences [physics]/Materials
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von Blayac, Sylvain ; Rivero, Christian ; Fornara, Pascal ; et al.
IEEE Transactions on Semiconductor Manufacturing ; volume 25, issue 4, page 564-570 ; ISSN 0894-6507 1558-2345
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von Raguet, Jean-René ; Calenzo, Patrick ; Laffont, Romain ; et al.
ISSN: 0021-4922 ; Japanese Journal of Applied Physics ; https://hal.science/hal-05006735 ; Japanese Journal of Applied Physics, 2009, 48 (4S), pp.04C058. ⟨10.1143/JJAP.48.04C058⟩.
Schlagworte: [SPI]Engineering Sciences [physics]
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von Ivano Pecorella ; Fabio Fania ; Patrizio Spadanuda ; et al.
Schlagworte: frumento duro; varieta
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von Pasquale Codianni ; Anna Maria Mastrangelo ; Michele Fornara ; et al.
Italian Journal of Agronomy, Vol 2, Iss 3, Pp 291-302 (2007)
Schlagworte: Agriculture; Plant culture; SB1-1110
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von Tomas, Rogelio ; Fornara, Andrea ; Salvant, Benoit ; et al.
Schlagworte: Accelerators and Storage Rings
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von CODIANNI PASQUALE ; CATTIVELLI LUIGI ; DE VITA PASQUALE ; et al.
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von Christopher Springer ; Francesco Greco ; Riccardo Autorino ; et al.
Schlagworte: LESS; complication; laparoendoscopic single-site surgery; partial nephrectomy; warm ischaemia time. LAPAROSCOPIC PARTIAL NEPHRECTOMY; RADICAL NEPHRECTOMY; CELL CARCINOMA; WARM ISCHEMIA; SURGERY; COMPLICATIONS; CANCER; EXPERIENCE
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von Autorino, Riccardo ; Rha, Koon Ho ; Yinghao, Sun ; et al.
Journal of Urology ; volume 185, issue 4S ; ISSN 0022-5347 1527-3792
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von Autorino, Riccardo ; Yakoubi, Rachid ; Rha, Koon Ho ; et al.
In The Journal of Urology April 2012 187(4) Supplement:e411-e412
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