Bald neuer Katalog: sichern Sie sich schon vorab Ihre persönlichen Merklisten im Nutzerkonto: Anleitung.

Volltext-Artikel, E-Books und Literaturhinweise aus dem EBSCO Discovery Service

"Artikel & mehr" berücksichtigt nur einen Teil der für die Bibliothek der Frankfurt UAS verfügbaren Datenbanken. Zur Übersicht in DBIS

Ergebnis verändern

einschränken: Volltextzugriff; Academic (peer-reviewed) journals
erweitern: Auch Volltexte der Artikel durchsuchen; Verwandte Themen suchen

Publikationstyp

Thema

erschienen in

Verlag

Geographic terms

Sprache

University

Datenbank

Erscheinungsjahr

Von:

Bis:

Treffer 1 - 25 von 786891, Suchdauer: 1.6s

12 3 4 5 6 7 8 9 10 11 weiter »

1
Overcoming Size Effect With Low-Thermal-Budget Supercritical Fluid Oxygen Treatment for HZO-Based Ferroelectric Capacitors

von Hsu, J. ; Chen, P. ; Chen, M. ; et al.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(4):1802-1808 Apr, 2026
- Zum Volltext in IEEE Xplore
Merkliste

2
Effects of Composition and Ozone Treatment on the Electrical Performance and Stability of ALD Indium Gallium Oxide TFTs

von Yang, H. ; Li, Y. ; Lin, G. ; et al.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(3):1387-1394 Mar, 2026
- Zum Volltext in IEEE Xplore
Merkliste

3
Analysis of the Temperature-Dependent Mechanism of MIS-HEMT in Negative Bias Stress Under X-Ray Irradiation

von Lin, C. ; Yeh, C. ; Chen, P. ; et al.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(3):1210-1217 Mar, 2026
- Zum Volltext in IEEE Xplore
Merkliste

4
Using Thermally Oxide Electrode MoO2 to Reduce Read/Write Delay and Enhance Hamming Distance of FeCAM at 85 °C

von Hsu, C.-H ; Hsiung, M.-H ; Chen, H.-M. ; et al.

2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE. :1-3 Mar, 2026
- Zum Volltext in IEEE Xplore
Merkliste

5
Demonstration of AND-Type 3-bit/cell 2T1C Memory Featuring 1.5 V Operation, Immediate Read-After-Write, 3.5 V Memory Window, 1010 Cycle Endurance, and Fast Neuro Learning

von Meng, W.-C. ; Huang, S.-T. ; Hsiung, M.-H. ; et al.

2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE. :1-3 Mar, 2026
- Zum Volltext in IEEE Xplore
Merkliste

6
Synergizing Centimeter-Scale Diffusion With High Refractive Index Contrast in Infrared GRIN Glass - A Low-Temperature Fused Deposition Approach

von Huang, C. ; Kang, S. ; Gao, C. ; et al.

Journal of Lightwave Technology J. Lightwave Technol. Lightwave Technology, Journal of. 44(10):4173-4182 May, 2026
- Zum Volltext in IEEE Xplore
Merkliste

7
A Dual-Arm Robotic System With Virtual Fixture-Guided Light Tracking for Fundus Surgery

von Wang, Z. ; Guang, C. ; Zheng, Y. ; et al.

IEEE Transactions on Medical Robotics and Bionics IEEE Trans. Med. Robot. Bionics Medical Robotics and Bionics, IEEE Transactions on. 8(2):642-653 May, 2026
- Zum Volltext in IEEE Xplore
Merkliste

8
Revisiting 360 Depth Estimation With PanoGabor: A New Fusion Perspective

von Shen, Z. ; Lin, C. ; Nie, L. ; et al.

IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 48(5):5979-5991 May, 2026
- Zum Volltext in IEEE Xplore
Merkliste

9
First Measurement of the $D_s^+\rightarrow K^{*}(892)^0μ^+ν_μ$ Decay, Study of Dynamics and Test of Lepton Universality with $D_s^+\rightarrow K^{*}(892)^0\ell^+ν_{\ell}$ Decays

von BESIII Collaboration ; Ablikim, M. ; Achasov, M. N. ; et al.

Schlagworte: High Energy Physics - Experiment
- View full text via Arxiv
Merkliste

10
Emergency Computation Offloading for Virtual Power Plants Under Edge Server DDoS Attacks

von Lin, C. ; Hu, B. ; Wang, K. ; et al.

IEEE Transactions on Smart Grid IEEE Trans. Smart Grid Smart Grid, IEEE Transactions on. 17(3):2599-2613 May, 2026
- Zum Volltext in IEEE Xplore
Merkliste

11
Measurement of the Absolute Branching Fraction of Xi(1530)^{-} to (Xi pi)^{-} and Updated Measurement of the Branching Fraction of psi(3686) to anti-Xi^{+} Xi(1530)^{-} + c.c

von BESIII Collaboration ; Ablikim, M. ; Achasov, M. N. ; et al.

Schlagworte: High Energy Physics - Experiment
- View full text via Arxiv
Merkliste

12
A Proton Irradiation Damage Compact Model of HfOx/TiOx Heterojunction Memristive Synapses for Hardening Design of Convolutional Neural Network Hardware

von Yin, S. ; Song, H. ; Ma, C. ; et al.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(4):2352-2359 Apr, 2026
- Zum Volltext in IEEE Xplore
Merkliste

13
Observation of a Doubly-strange Hyperon $Ξ(1720)$ in $J/ψ\rightarrow{}K^{-}Σ^0\barΞ^{+}+c.c.$

von BESIII Collaboration ; Ablikim, M. ; Achasov, M. N. ; et al.

Schlagworte: High Energy Physics - Experiment
- View full text via Arxiv
Merkliste

14
Design and Implementation of RF Circuit Under Inductor (CUI) in CMOS Technologies

von Hsieh, H. ; Chang, W. ; Chen, S. ; et al.

IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 74(4):3379-3388 Apr, 2026
- Zum Volltext in IEEE Xplore
Merkliste

15
Zeptosecond Control of Fano Line Shapes in Laser-Dressed Atoms Excited by Time-Delayed Attosecond Pulse Pairs

von Fu, Yong ; Wang, Bincheng ; Tang, Xiangyu ; et al.

ACS Photonics. 13(9):2670-2677
- View full text at ACS Publications
Merkliste

16
First evidence of the decay $B^+\toπ^+ e^+ e^-$

von LHCb collaboration ; Aaij, R. ; Abdelmotteleb, A. S. W. ; et al.

Schlagworte: High Energy Physics - Experiment
- View full text via Arxiv
Merkliste

17
Boosting Multi-Modal Large Language Model With Enhanced Visual Features

von Ma, Y. ; Lin, W. ; Wang, Z. ; et al.

IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 48(4):4524-4538 Apr, 2026
- Zum Volltext in IEEE Xplore
Merkliste

18
Observation of a new excited charm-strange meson $D_{s1}(2933)^+$ in $B^0\to D^+ D^- K^+ π^-$ decays

von LHCb collaboration ; Aaij, R. ; Abdelfatah, M. ; et al.

Schlagworte: High Energy Physics - Experiment
- View full text via Arxiv
Merkliste

19
Performance Enhancement of Piezoelectric MEMS Microspeaker Using Jointed and Separated Curved Cantilever Array With Modulation Circuits

von Lin, C. ; Tseng, C. ; Tsai, T. ; et al.

IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 26(7):9422-9430 Apr, 2026
- Zum Volltext in IEEE Xplore
Merkliste

20
Study of the $B^0 \to Λ_c^+ \barΛ_c^- K_S^0$ decay

von LHCb collaboration ; Aaij, R. ; Abdelfatah, M. ; et al.

Schlagworte: High Energy Physics - Experiment
- View full text via Arxiv
Merkliste

21
Stacked DRAM Solution: Multilayer Horizontal Cell (MHC) 1T1C DRAM

von Shao, K. ; Yuan, L. ; Song, Z. ; et al.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(3):1692-1696 Mar, 2026
- Zum Volltext in IEEE Xplore
Merkliste

22
Observation of the Exotic State $π_{1}(1600)$ in $ψ(2S)\rightarrowγχ_{c1},χ_{c1}\rightarrowπ^{+}π^{-}η'$

von BESIII Collaboration ; Ablikim, M. ; Achasov, M. N. ; et al.

Schlagworte: High Energy Physics - Experiment
- View full text via Arxiv
Merkliste

23
Analysis of Reverse Breakdown Mechanisms and Bias-Dependent Conduction Path Evolution in p-GaN HEMTs

von Lin, C. ; Lee, Y. ; Chen, P. ; et al.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(3):1285-1291 Mar, 2026
- Zum Volltext in IEEE Xplore
Merkliste

24
Measurement of the $W$-boson production cross-sections in $pp$ collisions at $\sqrt{s}$ = 13 TeV in the forward region

von LHCb collaboration ; Aaij, R. ; Abdelfatah, M. ; et al.

Schlagworte: High Energy Physics - Experiment
- View full text via Arxiv
Merkliste

25
Cost-Efficient Bidirectional ESD Protection for 650-V GaN Power HEMT With Co-Packaged Transient Voltage Suppressor

von Ker, C. ; Lin, C. ; Ker, M. ; et al.

IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 26(1):235-243 Mar, 2026
- Zum Volltext in IEEE Xplore
Merkliste

12 3 4 5 6 7 8 9 10 11 weiter »

Sie haben nicht gefunden, wonach Sie gesucht haben? Diese Services können Ihnen weiterhelfen.
Hilfe & Kontakt ǀ Fernleihe | Hilfe zur Fernleihe ǀ Literaturvorschlag| Literaturvorschlag