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1
von Cavaliere, A. ; Modolo, N. ; Santi, C.D. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(5):2252-2258 May, 2025
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2
von Modolo, N. ; De Santi, C. ; Sicre, S. ; et al.
IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 39(6):7045-7051 Jun, 2024
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3
von Fortuno, Cristina ; Frone, Megan N. ; Mester, Jessica ; et al.
Genome Medicine. 17(1)
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4
von Modolo, N. ; De Santi, C. ; Baratella, G. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1646-1653 Mar, 2024
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5
von Modolo, N. ; De Santi, C. ; Baratella, G. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(8):4432-4437 Aug, 2022
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6
von Modolo, N. ; De Santi, C. ; Minetto, A. ; et al.
IEEE Journal of Emerging and Selected Topics in Power Electronics IEEE J. Emerg. Sel. Topics Power Electron. Emerging and Selected Topics in Power Electronics, IEEE Journal of. 10(5):5019-5026 Oct, 2022
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7
von Minetto, A. ; Modolo, N. ; Sayadi, L. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(10):5003-5008 Oct, 2021
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8
von Masters, A. ; Modolo, R. ; Roussos, E. ; et al.
Space Science Reviews. 221(2)
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9
von Cavaliere, A. ; Modolo, N. ; De Santi, C. ; et al.
In Microelectronics Reliability August 2025 171
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10
von Hofer, A.M. ; Koller, C. ; Modolo, N. ; et al.
In Microelectronics Reliability June 2025 169
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11
von Modolo, N. ; De Santi, C. ; Minetto, A. ; et al.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(5):673-676 May, 2021
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12
von Modolo, N. ; Tang, S. ; Jiang, H. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(4):1489-1494 Apr, 2021
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13
von Minetto, A. ; Deutschmann, B. ; Modolo, N. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4602-4605 Nov, 2020
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14
von Wahlund, J.-E. ; Bergman, J. E. S. ; Åhlén, L. ; et al.
Space Science Reviews. 221(1)
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15
von Lina Z. Hadid ; Dominique Delcourt ; Yuki Harada ; et al.
Communications Physics, Vol 7, Iss 1, Pp 1-7 (2024)
Schlagworte: Astrophysics; QB460-466; Physics; QC1-999
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16
von Sharma, C. ; Modolo, N. ; Wu, T. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(3):1126-1131 Mar, 2020
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17
von Hadid, L. Z. ; Chust, T. ; Wahlund, Jan-Erik ; et al.
Schlagworte: Enceladus; Saturn; Alfv & Atilde; (c) n-wing; electrodynamic coupling; icy moons; outer planets; Astronomy, Astrophysics and Cosmology; Astronomi, astrofysik och kosmologi; Fusion, Plasma and Space Physics; Fusion, plasma och rymdfysik; Article in journal; info:eu-repo/semantics/article; text
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18
von Gao, Z. ; Chiocchetta, F. ; De Santi, C. ; et al.
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P51-1-P51-6 Mar, 2022
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19
von Kim, K. ; Modolo, R. ; Edberg, N. J. T. ; et al.
Journal of Geophysical Research. Space Physics. Apr2026, Vol. 131 Issue 4, p1-16. 16p.
Schlagworte: Magnetosphere; Atmospheric ionization; Magnetic field measurements; Electric fields; Fast ions; Electron density
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20
von Modolo, N. ; Fregolent, M. ; Masin, F. ; et al.
In Microelectronics Reliability November 2022 138
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21
von Tang, Y.-T ; Fan, C.-L. ; Kao, Y.-C. ; et al.
2019 Symposium on VLSI Technology VLSI Technology, 2019 Symposium on. :T222-T223 Jun, 2019
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22
von De Santi, C. ; Buffolo, M. ; Rossetto, I. ; et al.
In e-Prime - Advances in Electrical Engineering, Electronics and Energy 2021 1
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23
von M. Persson ; S. Aizawa ; N. André ; et al.
Nature Communications, Vol 13, Iss 1, Pp 1-10 (2022)
Schlagworte: Science
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24
von Alvarez, Adrian ; Bagshaw, Sean ; Biccard, Bruce ; et al.
In The Lancet Global Health April 2025 13(4):e635-e645
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25
von Bravo, Laura ; Simões, Joana FF ; Cardoso, Victor R ; et al.
In The Lancet Digital Health July 2024 6(7):e507-e519
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