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von Yu, Hao ; Gupta, A. ; Kuo, Y.-C. ; et al.
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-8 Mar, 2026
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von Wu, Wei-Min ; Su, C.-Y. ; Yu, H. ; et al.
2025 47th Annual EOS/ESD Symposium (EOS/ESD) EOS/ESD Symposium (EOS/ESD), 2025 47th Annual. 47:1-7 Sep, 2025
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von Yesayan, A. ; Jazaeri, F. ; Parvais, B. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 72(11):5919-5925 Nov, 2025
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von Yu, Hao ; ElKashlan, R. ; Tsai, M.-C. ; et al.
2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :1-6 Mar, 2025
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von Yu, H. ; Yadav, S. ; O'Sullivan, B. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(12):7308-7313 Dec, 2024
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von O'Sullivan, B. J. ; Alian, A. ; Sibaja-Hernandez, A. ; et al.
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-9 Apr, 2024
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von Yu, Hao ; Fang, J. ; Vermeersch, B. ; et al.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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von Yadav, S. ; Alian, A. ; ElKashlan, R. ; et al.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
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von Rathi, A. ; O'Sullivan, B.J. ; ElKashlan, R. ; et al.
2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :P71.RF-1-P71.RF-6 Mar, 2025
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von Cardinael, P. ; Yadav, S. ; Rack, M. ; et al.
IEEE Microwave and Wireless Technology Letters IEEE Microw. Wireless Tech. Lett. Microwave and Wireless Technology Letters, IEEE. 34(3):298-301 Mar, 2024
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von Cardinael, P. ; Yadav, S. ; Parvais, B. ; et al.
IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:322-330 2024
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von Mols, Y. ; Alcotte, R. ; Guo, Z.X. ; et al.
In Materials Science in Semiconductor Processing September 2026 212
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von Van Winckel, S. ; Caglar, A. ; Gys, B. ; et al.
ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) Solid State Circuits Conference (ESSCIRC), ESSCIRC 2022- IEEE 48th European. :61-64 Sep, 2022
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von Parvais, B. ; ElKashlan, R. ; Yu, H. ; et al.
2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :247-250 Sep, 2021
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von Beckers, A. ; Michl, J. ; Grill, A. ; et al.
IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 22:590-596 2023
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von Cardinael, P. ; Yadav, S. ; Zhao, M. ; et al.
ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2021 - IEEE 51st European. :303-306 Sep, 2021
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von Parvais, B. ; Vais, A. ; Yadav, S. ; et al.
2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :250-252 Mar, 2022
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von Rzepa, G. ; Karner, M. ; Baumgartner, O. ; et al.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021
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von Xiang, Y. ; Tyaginov, S. ; Vandemaele, M. ; et al.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-9 Mar, 2021
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von Yadav, S. ; Vais, A. ; ElKashlan, R. Y. ; et al.
2020 15th European Microwave Integrated Circuits Conference (EuMIC) Microwave Integrated Circuits Conference (EuMIC), 2020 15th European. :89-92 Jan, 2021
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von Collaert, N. ; Alian, A. ; Banerjee, A. ; et al.
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) Solid-State & Integrated Circuit Technology (ICSICT, 2020 IEEE 15th International Conference on. :1-4 Nov, 2020
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von Michl, J. ; Grill, A. ; Waldhoer, D. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(12):6372-6378 Dec, 2021
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