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von Bouslama, Mohamed ; Jakani, Anass ; Jacquet, Jean-Claude ; et al.
2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-6 Sep, 2025
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von Jakani, Anass ; Jacquet, Jean-Claude ; Kakou, N'Doua Luc Arnaud ; et al.
2025 31st International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) Thermal Investigations of ICs and Systems (THERMINIC), 2025 31st International Workshop on. :1-5 Sep, 2025
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von Bellomonte, Giuseppe ; Atawa, Bienvenu ; Serghei, Anatoli ; et al.
2022 14th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) Advanced Semiconductor Devices and Microsystems (ASDAM), 2022 14th International Conference on. :1-5 Oct, 2022
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von Garnier, Arnaud ; Castagne, Laetitia ; Greco, Florent ; et al.
2021 IEEE 71st Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2021 IEEE 71st. :2016-2023 Jun, 2021
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von Bicakli, Derya Hopanci ; Sungurtekin, Hulya ; Gungor, Levent ; et al.
In Clinical Nutrition February 2026 57
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von Jakani, Anass ; Jacquet, Jean-Claude ; Kakou, N'Doua Luc Arnaud ; et al.
31st International Workshop on Thermal Investigations of ICs and Systems; https://hal.science/hal-05297921; 31st International Workshop on Thermal Investigations of ICs and Systems, Sep 2025, Naples, Italy
Schlagworte: Thermal simulation; HEMT GaN; System in Package (SIP); Infrared measurement; thermal measurement; Fan-Out Wafer Level Packaging (FOWLP); Fan-Out Wafer Level Packaging (FOWLP) thermal measurement Infrared measurement Thermal simulation HEMT GaN System in Package (SIP); [SPI]Engineering Sciences [physics]
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von Dufraisse, Jeremy ; Callet, Guillaume ; Jardel, Olivier ; et al.
2011 6th European Microwave Integrated Circuit Conference Microwave Integrated Circuits Conference (EuMIC), 2011 European. :140-143 Oct, 2011
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von Delage, Sylvain L. ; Morvan, Erwan ; Sarazin, Nicolas ; et al.
18-th INTERNATIONAL CONFERENCE ON MICROWAVES, RADAR AND WIRELESS COMMUNICATIONS Microwave Radar and Wireless Communications (MIKON), 2010 18th International Conference on. :1-5 Jun, 2010
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von Godin, Jean ; Nodjiadjim, Virginie ; Riet, Muriel ; et al.
2009 Annual IEEE Compound Semiconductor Integrated Circuit Symposium Compound Semiconductor Integrated Circuit Symposium, 2009. CISC 2009. Annual IEEE. :1-4 Oct, 2009
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von Bahat, Gulistan ; Pinar, Ezgi ; Abbasoglu, Osman ; et al.
Schlagworte: Consensus; Expert; Malnutrition; Medical nutrition; Oral nutritional supplements; Practice; Nutrition and Dietetics; Näringslära och dietkunskap; Article in journal; info:eu-repo/semantics/article; text
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von Perkisas, Stany ; Bastijns, Sophie ; Baudry, Stéphane ; et al.
European Geriatric Medicine. 12(1):45-59
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von Perkisas, Stany ; Baudry, Stéphane ; Bauer, Jürgen ; et al.
European Geriatric Medicine. 9(6):739-757
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von Nsele, Séraphin Dieudonné ; Escotte, Laurent ; Tartarin, Jean-Guy ; et al.
Noise and Fluctuations (ICNF), 2013 22nd International Conference on ; International Conference on Noise and Fluctuations ; https://hal.science/hal-00859789 ; International Conference on Noise and Fluctuations, Jun 2013, Montpellier, France. pp.10.1109/ICNF.2013.6578989
Schlagworte: [SPI.TRON]Engineering Sciences [physics]/Electronics
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von Nsele, Séraphin Dieudonné ; Escotte, Laurent ; Tartarin, Jean-Guy ; et al.
Journées Nationales Microondes ; https://hal.science/hal-00860965 ; Journées Nationales Microondes, May 2013, Paris, France. pp.Id263
Schlagworte: [SPI.TRON]Engineering Sciences [physics]/Electronics
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von Perkisas, Stany ; Baudry, Stéphane ; Bauer, Jürgen ; et al.
European Geriatric Medicine. 10(1):157-158
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von Nsele, Séraphin Dieudonné ; Escotte, Laurent ; Tartarin, Jean-Guy ; et al.
ISSN: 0018-9383 ; IEEE Transactions on Electron Devices ; https://hal.science/hal-00859123 ; IEEE Transactions on Electron Devices, 2013, 60 (4), pp. 1372-1378.
Schlagworte: [SPI.TRON]Engineering Sciences [physics]/Electronics
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von Diakonova, Nina ; El Fatimy, Abdelouahad ; Meziani, Yahya Moubarak ; et al.
ISSN: 0587-4246.
Schlagworte: [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]
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von Jardel, Olivier ; Callet, Guillaume ; Dufraisse, Jérémy ; et al.
International Journal of Microwave and Wireless Technologies ; volume 3, issue 3, page 301-309 ; ISSN 1759-0787 1759-0795
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von Perkisas, Stany ; Bastijns, Sophie ; Baudry, Stephane ; et al.
Perkisas, S, Bastijns, S, Baudry, S, Bauer, J, Beaudart, C, Beckwee, D, Cruz-Jentoft, A, Gasowski, J, Hobbelen, H, Jager-Wittenaar, H, Kasiukiewicz, A, Landi, F, Malek, M, Marco, E, Martone, A M, de Miguel, A M, Piotrowicz, K, Sanchez, E, Sanchez-Rodriguez, D, Scafoglieri, A, Vandewoude, M, Verhoeven, V, Wojszel, Z B & De Cock, A-M 2021, 'Application of ultrasound for muscle assessment in sarcopenia : 2020 SARCUS update', European Geriatric Medicine, vol. 12, no. 1, pp. 45-59.
Schlagworte: Ultrasound; Sarcopenia; Muscle; Assessment; Protocol; SARCUS; CROSS-SECTIONAL AREA; SKELETAL-MUSCLE; THICKNESS MEASUREMENTS; ECHO INTENSITY; OLDER-ADULTS; ULTRASONOGRAPHIC ASSESSMENT; SUPRAHYOID MUSCLES; BEDSIDE ULTRASOUND; SIZE; MASS; info:eu-repo/semantics/review; info:eu-repo/semantics/publishedVersion
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von Bourlier, Yoan ; Bouttemy, Muriel ; Frégnaux, Mathieu ; et al.
ECASIA 18th ; https://hal.science/hal-04404063 ; ECASIA 18th, Sep 2019, Dresde, Germany
Schlagworte: [CHIM]Chemical Sciences
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von Piotrowicz, Stéphane ; Patard, O. ; Gamarra, P. ; et al.
21èmes Journées Nationales Micro-Ondes; https://hal.science/hal-02460542; 21èmes Journées Nationales Micro-Ondes, May 2019, –Caen, France
Schlagworte: [SPI]Engineering Sciences [physics]; [SPI.TRON]Engineering Sciences [physics]/Electronics
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von Bourlier, Yoan ; Bouttemy, Muriel ; Frégnaux, Mathieu ; et al.
ISSN: 0142-2421.
Schlagworte: [CHIM.MATE]Chemical Sciences/Material chemistry
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von Trassaert, S. ; Boudart, B. ; Piotrowicz, Stephane ; et al.
ISSN: 0734-211X.
Schlagworte: [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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von Bourlier, Yoan ; Bouttemy, Muriel ; Patard, Olivier ; et al.
ECS meeting ; https://hal.science/hal-04403480 ; ECS meeting, May 2018, Seattle, United States
Schlagworte: [CHIM]Chemical Sciences
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