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1
von Millesimo, M. ; Valentini, L. ; Fiegna, C. ; et al.
2025 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2025 IEEE International. :01-07 Mar, 2025
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2
von Millesimo, M. ; Fiegna, C. ; Bakeroot, B. ; et al.
2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024
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3
von Lin, W. ; Bakeroot, B. ; Huang, Z. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(8):4874-4878 Aug, 2024
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5
von Millesimo, M. ; Borga, M. ; Valentini, L. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(10):5203-5209 Oct, 2023
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6
von Tang, S. ; Bakeroot, B. ; Huang, Z. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(2):449-453 Feb, 2023
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7
von Modolo, N. ; De Santi, C. ; Baratella, G. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(8):4432-4437 Aug, 2022
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8
von Millesimo, M. ; Borga, M. ; Bakeroot, B. ; et al.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(11):1846-1849 Nov, 2022
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9
von Fabris, E. ; Borga, M. ; Posthuma, N. ; et al.
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021
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10
TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs
von Tallarico, A.N. ; Millesimo, M. ; Bakeroot, B. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(2):507-513 Feb, 2022
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11
von Millesimo, M. ; Fiegna, C. ; Posthuma, N. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(11):5701-5706 Nov, 2021
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12
von Li, X. ; Posthuma, N. ; Bakeroot, B. ; et al.
IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 36(5):4927-4930 May, 2021
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13
von Millesimo, M. ; Posthuma, N. ; Bakeroot, B. ; et al.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(1):57-63 Mar, 2021
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14
von Li, X. ; Bakeroot, B. ; Wu, Z. ; et al.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(4):577-580 Apr, 2020
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15
von Stoffels, S. ; Posthuma, N. ; Decoutere, S. ; et al.
2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-10 Mar, 2019
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16
von Posthuma, N. E. ; You, S. ; Stoffels, S. ; et al.
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2018 IEEE 30th International Symposium on. :284-287 May, 2018
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17
von Millesimo, M. ; Bakeroot, B. ; Borga, M. ; et al.
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :10B.2-1-10B.2-6 Mar, 2022
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18
von Y. Smit ; L. Verweij ; A. Currie ; et al.
Cancer Medicine, Vol 14, Iss 8, Pp n/a-n/a (2025)
Schlagworte: chronic myeloid leukemia; evidence ecosystem; learning healthcare environment; patient‐reported outcome measures; real‐world evidence; toxicity monitoring; Neoplasms. Tumors. Oncology. Including cancer and carcinogens; RC254-282
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19
von Tallarico, A.N. ; Stoffels, S. ; Posthuma, N. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(11):4829-4835 Nov, 2019
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20
von Bordelon, Mitchell M. ; Liu, Chunxiao ; Posthuma, Lorenzo ; et al.
Phys. Rev. B 103, 014420 (2021)
Schlagworte: Condensed Matter - Strongly Correlated Electrons; Condensed Matter - Materials Science
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21
von Posthuma, N. E. ; You, S. ; Stoffels, S. ; et al.
2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2018 IEEE 30th International Symposium on. :188-191 May, 2018
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22
von Posthuma, N. E. ; You, S. ; Liang, H. ; et al.
2016 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2016 28th International Symposium on. :95-98 Jun, 2016
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23
von Tallarico, A.N. ; Stoffels, S. ; Posthuma, N. ; et al.
IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 40(4):518-521 Apr, 2019
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24
von E. P. Tissink ; A. A. Shadrin ; D. van der Meer ; et al.
Nature Communications, Vol 15, Iss 1, Pp 1-13 (2024)
Schlagworte: Science
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25
von Borga, M. ; Meneghini, M. ; Stoffels, S. ; et al.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(7):2765-2770 Jul, 2018
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