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von Raiola, Pascal ; Paxian, Tobias ; Becker, Bernd
2020 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2020 IEEE. :1-6 May, 2020
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von Lylina, Natalia ; Atteya, Ahmed ; Raiola, Pascal ; et al.
2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-9 Nov, 2019
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3
von Thiemann, Benjamin ; Feiten, Linus ; Raiola, Pascal ; et al.
2019 IEEE European Test Symposium (ETS) Test Symposium (ETS), 2019 IEEE European. :1-6 May, 2019
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von Raiola, Pascal ; Thiemann, Benjamin ; Burchard, Jan ; et al.
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019. :1016-1021 Mar, 2019
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von Raiola, Pascal ; Kochte, Michael A. ; Atteya, Ahmed ; et al.
2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) On-Line Testing And Robust System Design (IOLTS), 2018 IEEE 24th International Symposium on. :91-96 Jul, 2018
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von Atteya, Ahmed ; Kochte, Michael A. ; Sauer, Matthias ; et al.
2018 IEEE 23rd European Test Symposium (ETS) Test Symposium (ETS), 2018 IEEE 23rd European. :1-6 May, 2018
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von Neubauer, Felix ; Burchard, Jan ; Raiola, Pascal ; et al.
2018 IEEE 36th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2018 IEEE 36th. :1-6 Apr, 2018
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von Kochte, Michael A. ; Sauer, Matthias ; Gomez, Laura Rodriguez ; et al.
2017 22nd IEEE European Test Symposium (ETS) Test Symposium (ETS), 2017 22nd IEEE. :1-6 May, 2017
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von Burchard, Jan ; Neubauer, Felix ; Raiola, Pascal ; et al.
2017 18th IEEE Latin American Test Symposium (LATS) Test Symposium (LATS), 2017 18th IEEE Latin American. :1-6 Mar, 2017
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von Sauer, Matthias ; Raiola, Pascal ; Feiten, Linus ; et al.
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017. :680-685 Mar, 2017
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11
von Raiola, Pascal ; Erb, Dominik ; Reddy, Sudhakar M. ; et al.
2017 30th International Conference on VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2017 16th International Conference on Embedded Systems (VLSID), 2017 30th International Conference on. :135-140 Jan, 2017
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von Paxian, Tobias ; Raiola, Pascal ; Becker, Bernd ; et al.
Verification, Model Checking, and Abstract Interpretation : 22nd International Conference, VMCAI 2021, Copenhagen, Denmark, January 17–19, 2021, Proceedings. 12597:556-577
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von Soeken, Mathias ; Raiola, Pascal ; Sterin, Baruch ; et al.
Hardware and Software: Verification and Testing : 12th International Haifa Verification Conference, HVC 2016, Haifa, Israel, November 14-17, 2016, Proceedings. 10028:1-17
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14
von Raiola, Pascal ; Burchard, Jan ; Neubauer, Felix ; et al.
Journal of Electronic Testing: Theory and Applications. :1-17
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von Wieczorek, Michele ; Labopin, Myriam ; Castagna, Luca ; et al.
In Blood 23 November 2021 138 Supplement 1:3890-3890
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22
von Esposito, Pasquale ; Gambella, Massimiliano ; Russo, Elisa ; et al.
Schlagworte: B-cell lymphoma; CAR-T therapy; blood purification; cytokine release syndrome; hemoadsorption; interleukin-6
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23
von Russo, Elisa ; Gambella, Massimiliano ; Raiola, Anna Maria ; et al.
Schlagworte: Acute kidney injury; CAR-T cell therapy; Cytokine release syndrome; Disease-free survival; Mortality; Performance status
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24
von Milani, Gregorio P. ; Rosa, Claudio ; Tuzger, Naz ; et al.
Schlagworte: Group A β-hemolytic streptococcus. Management; Antibiotic stewardship; Over prescription; Test
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von Bonora, Elena ; Chakrabarty, Sanjiban ; Kellaris, Georgios ; et al.
Schlagworte: LIG3; mtDNA replication; mtDNA repair; MNGIE; CIPO
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