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von Rundo, Francesco ; Castagnolo, Giulia ; Pino, Carmelo ; et al.
2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2025 IEEE International Conference on. :275-280 Oct, 2025
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von Pino, Carmelo ; Rundo, Francesco ; Castagnolo, Giulia ; et al.
2025 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), 2025 IEEE International Conference on. :287-292 Oct, 2025
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von Rundo, Francesco ; Spata, Massimo Orazio ; Pino, Carmelo ; et al.
2025 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW) ICCVW Computer Vision Workshops (ICCVW), 2025 IEEE/CVF International Conference on. :7353-7362 Oct, 2025
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von Rondinella, Alessia ; Guarnera, Francesco ; Rundo, Francesco ; et al.
2025 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW) ICCVW Computer Vision Workshops (ICCVW), 2025 IEEE/CVF International Conference on. :7417-7426 Oct, 2025
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von Mineo, Raffaele ; Palazzo, Simone ; Spampinato, Concetto ; et al.
2025 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW) ICCVW Computer Vision Workshops (ICCVW), 2025 IEEE/CVF International Conference on. :4053-4060 Oct, 2025
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von Rundo, Francesco ; Pino, Carmelo ; Castagnolo, Giulia ; et al.
2025 International Joint Conference on Neural Networks (IJCNN) Neural Networks (IJCNN), 2025 International Joint Conference on. :1-10 Jun, 2025
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von dAmbrosio, Moreno ; Tripodi, Chiara ; Garesci, Francesca ; et al.
2025 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2025 IEEE International Workshop on. :168-172 Jun, 2025
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von Rundo, Francesco ; Castagnolo, Giulia ; Pino, Carmelo ; et al.
2025 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2025 IEEE International Workshop on. :162-167 Jun, 2025
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von Castagnolo, G. ; Pino, C. ; Messina, A. A. ; et al.
2025 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2025 IEEE International Workshop on. :210-215 Jun, 2025
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von Rundo, F. ; Brancozzi, S. ; Orazio Spata, M. ; et al.
IEEE Access Access, IEEE. 13:182977-183001 2025
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von Rundo, Francesco ; Calabretta, Michele ; Rundo, Michael S. ; et al.
2024 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2024 IEEE International Workshop on. :18-23 Jun, 2024
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von Rundo, Francesco ; Calabretta, Michele ; Sitta, Alessandro ; et al.
2024 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2024 IEEE International Workshop on. :53-57 Jun, 2024
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von Rundo, F. ; Messina, A.A. ; Fiore, M. ; et al.
IEEE Open Journal of the Computer Society IEEE Open J. Comput. Soc. Computer Society, IEEE Open Journal of the. 6:1525-1536 2025
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von Fiore, Michele ; Sitta, Alessandro ; Sequenzia, Gaetano ; et al.
Design Tools and Methods in Industrial Engineering V : Proceedings of the Fifth International Conference on Design Tools and Methods in Industrial Engineering, ADM 2025, September 3–5, 2025, Genova, Italy, Volume 2. :181-189
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von Moradi, Morteza ; Moradi, Mohammad ; Rundo, Francesco ; et al.
Reproducible Research in Pattern Recognition : Fifth International Workshop, RRPR 2024, Kolkata, India, December 1, 2024, Revised Selected Papers. 15705:154-162
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von Amoroso, Davide Maria ; Donetti, Luca ; Schifano, Biagio ; et al.
2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2024 25th International Conference on. :1-8 Apr, 2024
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von Castagnolo, Giulia ; Spampinato, Concetto ; Rundo, Francesco ; et al.
2023 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2023 IEEE International Conference on. :3240-3244 Oct, 2023
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von Quaranta, Davide ; Conca, Francesca ; L’Abbate, Federica ; et al.
Neurological Sciences. 46(11):5771-5778
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von Moskalenko, Andrey ; Bryncev, Alexey ; Vatolin, Dmitry ; et al.
Schlagworte: Computer Science - Computer Vision and Pattern Recognition; Computer Science - Human-Computer Interaction; Computer Science - Multimedia; I.4.6; I.2.10
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von Rundo, Francesco ; Pino, Carmelo ; Castagnolo, Giulia ; et al.
2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), 2023 AEIT International Conference on. :1-6 Jul, 2023
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von Rundo, Francesco ; Pino, Carmelo ; Castagnolo, Giulia ; et al.
2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), 2023 AEIT International Conference on. :1-6 Jul, 2023
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von Rundo, Francesco ; Pino, Carmelo ; Castagnolo, Giulia ; et al.
2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), 2023 AEIT International Conference on. :1-5 Jul, 2023
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von Mauromicale, Giuseppe ; Sitta, Alessandro ; Rundo, Francesco ; et al.
2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE), 2023 AEIT International Conference on. :1-6 Jul, 2023
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von Spitalleri, Alessia ; Kavasidis, Isaak ; Cartelli, Vincenzo ; et al.
2023 International Conference on Intelligent Computing, Communication, Networking and Services (ICCNS) Intelligent Computing, Communication, Networking and Services (ICCNS), 2023 International Conference on. :105-110 Jun, 2023
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von Coscia, Pasquale ; Genovese, Angelo ; Piuri, Vincenzo ; et al.
2023 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA) Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA), 2023 IEEE International Conference on. :1-6 Jun, 2023
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