1
Pupil Premium Plus Post-16 Evaluation. Final Report

von Department for Education (DfE) (United Kingdom) ; Georgia Hyde-Dryden ; Emma Andersen ; et al.

UK Department for Education. 2026.

Schlagworte: Foreign Countries; Program Evaluation; Pilot Projects; Educational Finance; Postsecondary Education; Outcomes of Education; Program Effectiveness; Virtual Schools; Program Implementation; Resource Allocation; Expenditure per Student; Barriers; Cost Effectiveness
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2
Psychometric Properties of the Tech Career Scale

von National Foundation for Educational Research (NFER) (United Kingdom) ; Eren Ozberk ; Rachel Clutterbuck ; et al.

National Foundation for Educational Research. 2026.

Schlagworte: Psychometrics; Measures (Individuals); Technology; Knowledge Level; Grade 10; Career Development; Work Attitudes; Student Behavior; Student Attitudes; Test Construction; Test Validity; Barriers; Secondary School Students; Foreign Countries; Career Choice; Job Skills; Technology Education
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3
The Subprime PLUS Loan Crisis: How Dozens of Universities Steer Low-Income Families to Debt They Can't Afford. Education Policy & Higher Education

von New America ; Stephen Burd

New America. 2026.

Schlagworte: Student Loan Programs; Debt (Financial); Private Colleges; Public Colleges; Federal Programs; Parents; Low Income; Paying for College; College Students
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4
Time-Constrained Coverage Path Planning for UAV Search Applications

von Luterman, Alec ; Bortoff, Zachary ; Nogar, Stephen M. ; et al.

2026 International Conference on Unmanned Aircraft Systems (ICUAS) Unmanned Aircraft Systems (ICUAS), 2026 International Conference on. :243-250 Jun, 2026
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5
An Oceanic Small-UAS with Near–Surface Soaring Flight Sensory Design and Onboard Deep-Learned Meteorological Perception

von Carlson, Stephen J. ; Arora, Prateek ; Papachristos, Christos

2026 International Conference on Unmanned Aircraft Systems (ICUAS) Unmanned Aircraft Systems (ICUAS), 2026 International Conference on. :750-758 Jun, 2026
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6
Electrical Parameter Estimation of Electrically Excited Synchronous Machine With a Physics Informed Neural Network

von Hurt, Stephen E. ; Seyedi, S. Mehdi ; Tao, Guanhua ; et al.

2026 IEEE Transportation Electrification Conference & Expo (ITEC) & Electric Aircraft Technologies Symposium (EATS) (ITEC+EATS) Transportation Electrification Conference & Expo (ITEC) & Electric Aircraft Technologies Symposium (EATS) (ITEC+EATS), 2026 IEEE. :1-6 Jun, 2026
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7
A Review of Excitation Technologies in Rare-Earth Free Wound Rotor Synchronous Machines for Transportation Electrification

von Seyedi, S. Mehdi ; Hurt, Stephen E. ; Talebi, Dorsa ; et al.

2026 IEEE Transportation Electrification Conference & Expo (ITEC) & Electric Aircraft Technologies Symposium (EATS) (ITEC+EATS) Transportation Electrification Conference & Expo (ITEC) & Electric Aircraft Technologies Symposium (EATS) (ITEC+EATS), 2026 IEEE. :1-6 Jun, 2026
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8
A Multi-Agent AI Framework for Legal Argument Generation and Virtual Courtroom Simulation

von Kanmani, R. ; A, Stephen Rufus ; K, Siddharth ; et al.

2026 7th International Conference on Inventive Research in Computing Applications (ICIRCA) Inventive Research in Computing Applications (ICIRCA), 2026 7th International Conference on. :1358-1364 Jun, 2026
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9
Resilience Curves and Metrics for Artificial Intelligence Enabled Prognostics and Health Management Systems

von Adams, Stephen ; DeCollo, Dan ; Beling, Peter A. ; et al.

2026 IEEE International Conference on Prognostics and Health Management (ICPHM) Prognostics and Health Management (ICPHM), 2026 IEEE International Conference on. :114-121 Jun, 2026
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10
Bearing Testbed and Data Set for Out-of-Distribution Machine Learning Development

von Adams, Stephen ; Tiyyagura, Sunil Reddy ; Veeramani, Balaji ; et al.

2026 IEEE International Conference on Prognostics and Health Management (ICPHM) Prognostics and Health Management (ICPHM), 2026 IEEE International Conference on. :122-129 Jun, 2026
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11
Insights to Spectral Based Acoustic Emissions Detection of Partial Discharge

von Sim, Colin ; Pierson, Stephen ; Hu, Han ; et al.

2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-6 May, 2026
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12
Boosted Gate Driving With Active Damping To Reduce Turn-Off Losses in High Power SiC MOSFETs

von Watson, Max J. ; Neira, Sebastian ; Finney, Stephen ; et al.

2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-8 May, 2026
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13
Magnetic-Field-Based Switching Stage Detection for Closed-Loop Active Gate Driving to Suppress Overshoot and Oscillatory Switching Behaviour in SiC Power Modules

von Bai, Yuxiao ; Parker, Mason ; Sahin, Ilker ; et al.

2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-8 May, 2026
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14
Online Fault Diagnosis and Fault-Tolerant Operation of Power-Electronic Converters Using a Multi-Scale Convolutional Neural Network With Model Predictive Control

von Li, Ning ; Finney, Stephen ; Judge, Paul D.

2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-6 May, 2026
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15
High-Frequency Passivity Analysis of Virtual Admittance–Based Dual-Loop Grid-Forming Converters

von Obi, Stephen Arinze ; Jung, Jae-Jung

2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-8 May, 2026
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16
Additively Manufactured Interdigitated Capacitor for High Temperature Applications

von Busse, Erik ; Al-Zanina, Mousa ; Obeidat, Abdullah ; et al.

2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :1903-1909 May, 2026
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17
Experimental and Simulation-Based Assessment of Die Attach and Solder Mask Material Influence on Substrate Trace Cracking in BGA Packages

von Lee, Chu-Chung Stephen ; Lim, Jasmine ; Zhang, Ryan ; et al.

2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :1717-1724 May, 2026
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18
Time-Resolved 3D X-ray Imaging of Electromigration Void Evolution in 2.5D Package

von Yang, Junbo ; Cain, Stephen ; Gao, Yuhan ; et al.

2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :952-959 May, 2026
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19
Extreme High-Temperature Evaluation of Printed Platinum Materials for Aerospace Applications

von Obeidat, Abdullah S. ; Alshaibani, W T ; Busse, Erik ; et al.

2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :1448-1454 May, 2026
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20
Surface-Mounted Conformal Adhesive Electrodes for Impedance-Based Crack Detection in Composite Materials

von Al-Haidari, Riadh ; Falola, Babatunde ; Al-Zanina, Mousa ; et al.

2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :739-745 May, 2026
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21
3D Heterogenous Integration Packaging of 5G RF Systems using Additive Electronics

von Alshaibani, WT ; Obeidat, Abdullah S. ; Al-Haidari, Riadh ; et al.

2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :1891-1897 May, 2026
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22
Next-Generation Scanning Electron Microscope for Advanced Packaging: Coating-Free, Ambient, and Ready-to-Use

von Zhao, Weichen ; Yang, Junbo ; Gao, Yuhan ; et al.

2026 IEEE 76th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2026 IEEE 76th. :2456-2463 May, 2026
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23
Testing of a 12 bit SARA And Cand Analog Scan

von Coyette, Anthony ; Dobbelaere, Wim ; Dima, Doina ; et al.

2026 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2026 IEEE. :1-6 May, 2026
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24
Using Analog IJTAG to Measure ISO 26262 Metrics

von Praselski, Bartlomiej ; Sunter, Stephen

2026 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2026 IEEE. :1-6 May, 2026
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25
Pixel-Resolved Long-Context Learning for Turbulence at Exascale: Resolving Small-scale Eddies Toward the Viscous Limit

von Yin, Junqi ; Palash, Mijanur ; Laiu, M. Paul ; et al.

2026 IEEE International Parallel and Distributed Processing Symposium (IPDPS) IPDPS Parallel and Distributed Processing Symposium (IPDPS), 2026 IEEE International. :347-362 May, 2026
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