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1
von Tanaka, Tomonari ; Uezono, Takumi ; Suenaga, Kohei ; et al.
Proceedings of the 30th Asia and South Pacific Design Automation Conference. :966-973
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2
von Tanaka, Tomonari ; Uezono, Takumi ; Suenaga, Kohei ; et al.
Schlagworte: Computer Science - Hardware Architecture
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3
von Itsuji, Hiroaki ; Uezono, Takumi ; Toba, Tadanobu ; et al.
2023 IEEE 26th International Conference on Intelligent Transportation Systems (ITSC) Intelligent Transportation Systems (ITSC), 2023 IEEE 26th International Conference on. :4254-4259 Sep, 2023
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4
von Ito, Kojiro ; Itsuji, Hiroaki ; Uezono, Takumi ; et al.
2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2022 22nd European Conference on. :1-6 Oct, 2022
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5
von Uezono, Takumi ; He, Yi ; Li, Yanjing
2022 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2022 IEEE International. :465-473 Sep, 2022
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6
von Zhang, Yangchao ; Itsuji, Hiroaki ; Uezono, Takumi ; et al.
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :60-63 Mar, 2022
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7
von He, Yi ; Uezono, Takumi ; Li, Yanjing
2021 IEEE International Test Conference (ITC) ITC Test Conference (ITC), 2021 IEEE International. :93-102 Oct, 2021
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8
von Itsuji, Hiroaki ; Uezono, Takumi ; Toba, Tadanobu ; et al.
2020 IEEE International Test Conference (ITC) Test Conference (ITC), 2020 IEEE International. :1-5 Nov, 2020
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9
von Otani, Yuina ; Kawarai, Michiya ; Kobayashi, Masaki ; et al.
In Biochemistry and Biophysics Reports December 2025 44
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10
von Fujii, Takenori ; Uezono, Yu ; Otsuka, Takumi ; et al.
Schlagworte: Condensed Matter - Superconductivity
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11
von Uezono, Yu ; Otsuka, Takumi ; Hagisawa, Shotaro ; et al.
Schlagworte: Condensed Matter - Superconductivity
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12
von Zhang, Yangchao ; Ito, Kojiro ; Itsuji, Hiroaki ; et al.
2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2020 20th European Conference on. :1-3 Oct, 2020
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13
von Hiroaki Itsuji ; Takumi Uezono ; Tadanobu Toba ; et al.
IEEE Access, Vol 13, Pp 113890-113904 (2025)
Schlagworte: GPU; silent data corruption; reliability; fault injection; failure detection; diagnosis; Electrical engineering. Electronics. Nuclear engineering; TK1-9971
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14
von Toba, Tadanobu ; Shimbo, Kenichi ; Uezono, Takumi ; et al.
2017 IEEE 2nd Information Technology, Networking, Electronic and Automation Control Conference (ITNEC) Technology, Networking, Electronic and Automation Control Conference (ITNEC), 2017 IEEE 2nd Information. :634-641 Dec, 2017
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15
von Watanabe, Takao ; Otsuka, Takumi ; Hagisawa, Shotaro ; et al.
Modern Physics Letters B Vol. 34, Nos. 19 & 20 (2020) 2040051
Schlagworte: Condensed Matter - Superconductivity
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16
von Uezono, Takumi ; Toba, Tadanobu ; Shimbo, Kenichi ; et al.
2016 IEEE 25th Asian Test Symposium (ATS) Asian Test Symposium, 2016 IEEE 25th Asian Test Symposium (ATS), 2016 IEEE 25th. :293-297 Nov, 2016
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17
von Hiroaki Itsuji ; Takumi Uezono ; Tadanobu Toba ; et al.
IEEE Open Journal of Intelligent Transportation Systems, Vol 5, Pp 483-494 (2024)
Schlagworte: Artificial intelligence (AI); AI-enabled system; real-time monitoring; diagnostic technology; system reliability; Transportation engineering; TA1001-1280; Transportation and communications; HE1-9990
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18
von Uezono, Takumi ; Yoneki, Shinya ; Toba, Tadanobu ; et al.
2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2013 14th European Conference on. :1-4 Sep, 2013
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19
von Sato, Takashi ; Kozaki, Tadamichi ; Uezono, Takumi ; et al.
2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European. :143-146 Sep, 2011
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20
von Sato, Takashi ; Uezono, Takumi ; Nakayama, Noriaki ; et al.
2010 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2010 IEEE International Symposium on. :1053-1056 May, 2010
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21
von Uezono, Takumi ; Takahashi, Tomoyuki ; Shintani, Michihiro ; et al.
2010 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2010 IEEE International Symposium on. :3553-3556 May, 2010
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22
von Uezono, Takumi ; Takahashi, Tomoyuki ; Shintani, Michihiro ; et al.
2010 28th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2010 28th. :15-20 Apr, 2010
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23
von Amakawa, Shuhei ; Uezono, Takumi ; Sato, Takashi ; et al.
Proceedings of the 2007 international workshop on System level interconnect prediction. :1-8
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24
von Hagiwara, Shiho ; Uezono, Takumi ; Sato, Takashi ; et al.
Proceedings of the 17th ACM Great Lakes symposium on VLSI. :513-516
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25
von Uezono, Takumi ; Okada, Kenichi ; Masu, Kazuya
Proceedings of the 7th International Symposium on Quality Electronic Design. :479-484
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