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von João Pedro Marto ; Davide Strambo ; George Ntaios ; et al.
Journal of Stroke, Vol 27, Iss 1, Pp 128-132 (2025)
Schlagworte: Diseases of the circulatory (Cardiovascular) system; RC666-701
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von Prabhakara, V. ; Nuytten, T. ; Bender, H. ; et al.
Schlagworte: Physics - Optics; Physics - Applied Physics; Physics - Data Analysis, Statistics and Probability
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Schlagworte: Mathematics - Dynamical Systems; Mathematics - Algebraic Topology; Mathematics - Category Theory; 37Bxx, 55N30, 06Fxx
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von Op de Beeck, Jonathan ; Fleischmann, C. ; Vandervorst, W. ; et al.
The Journal of Physical Chemistry C. 124(11):6371-6378
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von Cantoro, M. ; Merckling, C. ; Jiang, S. ; et al.
2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE. :1-4 Oct, 2012
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von Loo, R. ; Vohra, A. ; Porret, C. ; et al.
2019 Compound Semiconductor Week (CSW) Compound Semiconductor Week (CSW), 2019. :1-2 May, 2019
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von Noda, T. ; Witters, L. ; Mitard, J. ; et al.
2013 13th International Workshop on Junction Technology (IWJT) Junction Technology (IWJT), 2013 13th International Workshop on. :78-83 Jun, 2013
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von Kondaiah, P. ; Madhavi, V. ; Uthanna, S. ; et al.
2012 International Conference on Emerging Electronics Emerging Electronics (ICEE), 2012 International Conference on. :1-4 Dec, 2012
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von Mody, J. ; Zschatzsch, G. ; Kolling, S. ; et al.
2012 12th International Workshop on Junction Technology Junction Technology (IWJT), 2012 12th International Workshop on. :94-99 May, 2012
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von Franquet, A. ; Spampinato, V. ; Kayser, S. ; et al.
In Vacuum August 2022 202
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von Celano, U. ; Hantschel, T. ; Boehme, T. ; et al.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :5.1.1-5.1.4 Dec, 2019
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von De Jaeger, B. ; Houssa, M. ; Satta, A. ; et al.
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :189-192 2004
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von Nackaerts, A. ; Ercken, M. ; Demuynck, S. ; et al.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :269-272 2004
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von Henson, K. ; Lander, R.J.P. ; Demand, M. ; et al.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :851-854 2004
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von Heyns, M. ; Beckx, S. ; Bender, H. ; et al.
2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :247-250 2003
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von Bender, H. ; Conard, T. ; Nohira, H. ; et al.
Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537) Gate insulator Gate Insulator, 2001. IWGI 2001. Extended Abstracts of International Workshop on. :86-92 2001
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von Cosnier, V. ; Bender, H. ; Caymax, A. ; et al.
Extended Abstracts of International Workshop on Gate Insulator. IWGI 2001 (IEEE Cat. No.01EX537) Gate insulator Gate Insulator, 2001. IWGI 2001. Extended Abstracts of International Workshop on. :226-229 2001
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von Lenoble, D. ; Doornbos, G. ; de Keersgieter, A. ; et al.
2006 International Workshop on Junction Technology Junction Technology, 2006. IWJT '06. International Workshop on. :78-83 2006
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von Adachi, K. ; Ohuchi, K. ; Aoki, N. ; et al.
2006 International Workshop on Junction Technology Junction Technology, 2006. IWJT '06. International Workshop on. :104-107 2006
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von Nafria, M. ; Blasco, X. ; Porti, M. ; et al.
Conference on Electron Devices, 2005 Spanish Electron devices Electron Devices, 2005 Spanish Conference on. :65-68 2005
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von Eyben, P. ; Fukutome, H. ; Alvarez, D. ; et al.
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :101-104 2004
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von Anand, S. ; Sun, Y.T. ; Lourdudoss, S. ; et al.
International Conference onIndium Phosphide and Related Materials, 2003. Indium phosphide and related materials Indium Phosphide and Related Materials, 2003. International Conference on. :563-566 2003
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von Hartwich, J. ; Alvarez, D. ; Dreeskornfeld, L. ; et al.
ESSDERC '03. 33rd Conference on European Solid-State Device Research, 2003. Solid-state device research - ESSDERC '03 European Solid-State Device Research, 2003. ESSDERC '03. 33rd Conference on. :427-430 2003
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von Vandervorst, W. ; Brijs, B. ; Bender, H. ; et al.
2003 8th International Symposium Plasma- and Process-Induced Damage. Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2003 8th International Symposium. :40-50 2003
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von Rochefort, C. ; van Dalen, R. ; Duhayon, N. ; et al.
Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 2002. Proceedings of the 14th International Symposium on. :237-240 2002
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